System-level Test and Validation of Hardware/Software Systems (Hardcover, 2005 ed.)


New manufacturing technologies have made possible the integration of entire systems on a single chip. This new design paradigm, termed system-on-chip (SOC), together with its associated manufacturing problems, represents a real challenge for designers.

SOC is also reshaping approaches to test and validation activities. These are beginning to migrate from the traditional register-transfer or gate levels of abstraction to the system level. Until now, test and validation have not been supported by system-level design tools so designers have lacked the infrastructure to exploit all the benefits stemming from the adoption of the system level of abstraction. Research efforts are already addressing this issue.

This monograph provides a state-of-the-art overview of the current validation and test techniques by covering all aspects of the subject including:

  • modeling of bugs and defects;
  • stimulus generation for validation and test purposes (including timing errors;
  • design for testability.

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Product Description

New manufacturing technologies have made possible the integration of entire systems on a single chip. This new design paradigm, termed system-on-chip (SOC), together with its associated manufacturing problems, represents a real challenge for designers.

SOC is also reshaping approaches to test and validation activities. These are beginning to migrate from the traditional register-transfer or gate levels of abstraction to the system level. Until now, test and validation have not been supported by system-level design tools so designers have lacked the infrastructure to exploit all the benefits stemming from the adoption of the system level of abstraction. Research efforts are already addressing this issue.

This monograph provides a state-of-the-art overview of the current validation and test techniques by covering all aspects of the subject including:

  • modeling of bugs and defects;
  • stimulus generation for validation and test purposes (including timing errors;
  • design for testability.

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Product Details

General

Imprint

Springer London

Country of origin

United Kingdom

Series

Springer Series in Advanced Microelectronics, 17

Release date

May 2005

Availability

Expected to ship within 12 - 17 working days

First published

2005

Editors

, ,

Dimensions

235 x 155 x 12mm (L x W x T)

Format

Hardcover

Pages

179

Edition

2005 ed.

ISBN-13

978-1-85233-899-2

Barcode

9781852338992

Categories

LSN

1-85233-899-7



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