Researchers in polymeric membranes as well as R&D professionals will find this work an essential addition to the literature. It concentrates on the method recently developed to study the surfaces of synthetic polymeric membranes using an Atomic Force Microscope (AFM), which is fast becoming a very important tool. Each chapter includes information on basic principles, commercial applications, an overview of current research and guidelines for future research.
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Researchers in polymeric membranes as well as R&D professionals will find this work an essential addition to the literature. It concentrates on the method recently developed to study the surfaces of synthetic polymeric membranes using an Atomic Force Microscope (AFM), which is fast becoming a very important tool. Each chapter includes information on basic principles, commercial applications, an overview of current research and guidelines for future research.
Imprint | Springer-Verlag |
Country of origin | Germany |
Series | Springer Laboratory |
Release date | November 2010 |
Availability | Expected to ship within 10 - 15 working days |
First published | 2008 |
Authors | K.C. Khulbe, C.Y. Feng, Takeshi Matsuura |
Dimensions | 235 x 155 x 11mm (L x W x T) |
Format | Paperback |
Pages | 198 |
Edition | Softcover reprint of hardcover 1st ed. 2008 |
ISBN-13 | 978-3-642-09327-2 |
Barcode | 9783642093272 |
Categories | |
LSN | 3-642-09327-2 |