Synthetic Polymeric Membranes - Characterization by Atomic Force Microscopy (Hardcover, 2008 ed.)

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Researchers in polymeric membranes as well as R&D professionals will find this work an essential addition to the literature. It concentrates on the method recently developed to study the surfaces of synthetic polymeric membranes using an Atomic Force Microscope (AFM), which is fast becoming a very important tool. Each chapter includes information on basic principles, commercial applications, an overview of current research and guidelines for future research.


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Product Description

Researchers in polymeric membranes as well as R&D professionals will find this work an essential addition to the literature. It concentrates on the method recently developed to study the surfaces of synthetic polymeric membranes using an Atomic Force Microscope (AFM), which is fast becoming a very important tool. Each chapter includes information on basic principles, commercial applications, an overview of current research and guidelines for future research.

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Product Details

General

Imprint

Springer-Verlag

Country of origin

Germany

Series

Springer Laboratory

Release date

December 2007

Availability

Expected to ship within 10 - 15 working days

First published

2008

Authors

, ,

Dimensions

235 x 155 x 14mm (L x W x T)

Format

Hardcover

Pages

198

Edition

2008 ed.

ISBN-13

978-3-540-73993-7

Barcode

9783540739937

Categories

LSN

3-540-73993-9



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