Super-Resolution Imaging (Paperback, Softcover reprint of the original 1st ed. 2002)


Super-Resolution Imaging serves as an essential reference for both academicians and practicing engineers. It can be used both as a text for advanced courses in imaging and as a desk reference for those working in multimedia, electrical engineering, computer science, and mathematics. The first book to cover the new research area of super-resolution imaging, this text includes work on the following groundbreaking topics: * Image zooming based on wavelets and generalized interpolation; * Super-resolution from sub-pixel shifts; * Use of blur as a cue; * Use of warping in super-resolution; * Resolution enhancement using multiple apertures; * Super-resolution from motion data; * Super-resolution from compressed video; * Limits in super-resolution imaging. Written by the leading experts in the field, Super-Resolution Imaging presents a comprehensive analysis of current technology, along with new research findings and directions for future work.

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Product Description

Super-Resolution Imaging serves as an essential reference for both academicians and practicing engineers. It can be used both as a text for advanced courses in imaging and as a desk reference for those working in multimedia, electrical engineering, computer science, and mathematics. The first book to cover the new research area of super-resolution imaging, this text includes work on the following groundbreaking topics: * Image zooming based on wavelets and generalized interpolation; * Super-resolution from sub-pixel shifts; * Use of blur as a cue; * Use of warping in super-resolution; * Resolution enhancement using multiple apertures; * Super-resolution from motion data; * Super-resolution from compressed video; * Limits in super-resolution imaging. Written by the leading experts in the field, Super-Resolution Imaging presents a comprehensive analysis of current technology, along with new research findings and directions for future work.

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Product Details

General

Imprint

Springer-Verlag New York

Country of origin

United States

Series

The Springer International Series in Engineering and Computer Science, 632

Release date

March 2013

Availability

Expected to ship within 10 - 15 working days

First published

2000

Editors

Dimensions

235 x 155 x 16mm (L x W x T)

Format

Paperback

Pages

280

Edition

Softcover reprint of the original 1st ed. 2002

ISBN-13

978-1-4757-7477-1

Barcode

9781475774771

Categories

LSN

1-4757-7477-X



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