Scan Statistics and Applications (Hardcover, 1999 ed.)


The study of scan statistics and their applications to many different scientific and engineering problems have received considerable attention in the literature recently. In addition to challenging theoretical problems, the area of scan statis tics has also found exciting applications in diverse disciplines such as archaeol ogy, astronomy, epidemiology, geography, material science, molecular biology, reconnaissance, reliability and quality control, sociology, and telecommunica tion. This will be clearly evident when one goes through this volume. In this volume, we have brought together a collection of experts working in this area of research in order to review some of the developments that have taken place over the years and also to present their new works and point out some open problems. With this in mind, we selected authors for this volume with some having theoretical interests and others being primarily concerned with applications of scan statistics. Our sincere hope is that this volume will thus provide a comprehensive survey of all the developments in this area of research and hence will serve as a valuable source as well as reference for theoreticians and applied researchers. Graduate students interested in this area will find this volume to be particularly useful as it points out many open challenging problems that they could pursue. This volume will also be appropriate for teaching a graduate-level special course on this topic."

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Product Description

The study of scan statistics and their applications to many different scientific and engineering problems have received considerable attention in the literature recently. In addition to challenging theoretical problems, the area of scan statis tics has also found exciting applications in diverse disciplines such as archaeol ogy, astronomy, epidemiology, geography, material science, molecular biology, reconnaissance, reliability and quality control, sociology, and telecommunica tion. This will be clearly evident when one goes through this volume. In this volume, we have brought together a collection of experts working in this area of research in order to review some of the developments that have taken place over the years and also to present their new works and point out some open problems. With this in mind, we selected authors for this volume with some having theoretical interests and others being primarily concerned with applications of scan statistics. Our sincere hope is that this volume will thus provide a comprehensive survey of all the developments in this area of research and hence will serve as a valuable source as well as reference for theoreticians and applied researchers. Graduate students interested in this area will find this volume to be particularly useful as it points out many open challenging problems that they could pursue. This volume will also be appropriate for teaching a graduate-level special course on this topic."

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Product Details

General

Imprint

Birkhauser Boston

Country of origin

United States

Series

Statistics for Industry and Technology

Release date

September 1999

Availability

Expected to ship within 12 - 17 working days

First published

1999

Editors

,

Dimensions

254 x 178 x 20mm (L x W x T)

Format

Hardcover

Pages

324

Edition

1999 ed.

ISBN-13

978-0-8176-4041-5

Barcode

9780817640415

Categories

LSN

0-8176-4041-X



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