Progress in Transmission Electron Microscopy 1 - Concepts and Techniques (Paperback, Softcover reprint of hardcover 1st ed. 2001)
Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications.
Or split into 4x interest-free payments of 25% on orders over R50
Learn more
45860
@R430pm x 12* 
Ships in 10 - 15 working days
Add to wish listDonate to Against Period Poverty
Product Description
Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications.
Customer Reviews
No reviews or ratings yet - be the first to create one!
Product Details
General
Imprint | Springer-Verlag |
Country of origin | Germany |
Series | Springer Series in Surface Sciences, 38 |
Release date | December 2010 |
Availability | Expected to ship within 10 - 15 working days |
First published | 2001 |
Editors | Xiaofeng Zhang, Ze Zhang |
Dimensions | 235 x 155 x 20mm (L x W x T) |
Format | Paperback |
Pages | 367 |
Edition | Softcover reprint of hardcover 1st ed. 2001 |
ISBN-13 | 978-3-642-08717-2 |
Barcode | 9783642087172 |
Categories | |
LSN | 3-642-08717-5 |
Be the first to know about our
latest deals & promos! Subscribe Now
