This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths.
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This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths.
Imprint | Springer-Verlag New York |
Country of origin | United States |
Series | Frontiers in Electronic Testing, 22B |
Release date | February 2003 |
Availability | Expected to ship within 10 - 15 working days |
First published | 2003 |
Authors | Nicola Nicolici, Bashir M. Al-Hashimi |
Dimensions | 297 x 210 x 12mm (L x W x T) |
Format | Hardcover |
Pages | 178 |
Edition | 2003 ed. |
ISBN-13 | 978-1-4020-7235-2 |
Barcode | 9781402072352 |
Categories | |
LSN | 1-4020-7235-X |