High-Resolution Imaging and Spectrometry of Materials (Hardcover, 2003 ed.)


This book gives a survey of, and systematic introduction to, high-resolution electron microscopy. The method is thoroughly discussed; the latest developments are reported; and applications to surface and interface analysis and to the study of hidden structures are detailed. The book arises from research carried out at one of the world's leading centers of electron microscopy. It will appeal to researchers and advanced students.

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Product Description

This book gives a survey of, and systematic introduction to, high-resolution electron microscopy. The method is thoroughly discussed; the latest developments are reported; and applications to surface and interface analysis and to the study of hidden structures are detailed. The book arises from research carried out at one of the world's leading centers of electron microscopy. It will appeal to researchers and advanced students.

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Product Details

General

Imprint

Springer-Verlag

Country of origin

Germany

Series

Springer Series in Materials Science, 50

Release date

December 2002

Availability

Expected to ship within 12 - 17 working days

First published

2003

Editors

,

Dimensions

235 x 155 x 41mm (L x W x T)

Format

Hardcover

Pages

442

Edition

2003 ed.

ISBN-13

978-3-540-41818-4

Barcode

9783540418184

Categories

LSN

3-540-41818-0



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