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Springer-Verlag New York
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VLSI Design for Manufacturing: Yield Enhancement (Hardcover, 1990 ed.)
Stephen W. Director
,
Wojciech Maly
,
Andrzej J. Strojwas
R
4,610
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From Contamination to Defects, Faults and Yield Loss - Simulation and Applications (Hardcover, 1996 ed.)
Jitendra B. Khare
,
Wojciech Maly
R
3,105
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From Contamination to Defects, Faults and Yield Loss - Simulation and Applications (Paperback, Softcover reprint of the original 1st ed. 1996)
Jitendra B. Khare
,
Wojciech Maly
R
2,965
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VLSI Design for Manufacturing: Yield Enhancement (Paperback, Softcover reprint of the original 1st ed. 1990)
Stephen W. Director
,
Wojciech Maly
,
Andrzej J. Strojwas
R
4,561
Add to Cart
Ships in 10 - 15 working days