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Springer-Verlag New York
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Impact of Electron and Scanning Probe Microscopy on Materials Research (Hardcover, 1999 ed.)
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Surface and Interface Characterization by Electron Optical Methods (Paperback, Softcover reprint of the original 1st ed. 1988)
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Impact of Electron and Scanning Probe Microscopy on Materials Research (Paperback, Softcover reprint of the original 1st ed. 1999)
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