VLSI Test Principles and Architectures - Design for Testability (Paperback)
Laung-terng Wang, Cheng-Wen Wu, Xiaoqing WenR2,454
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Product Details
General
Imprint | Morgan Kaufmann Publishers In |
Country of origin | United States |
Release date | July 2006 |
Availability | Supplier out of stock. If you add this item to your wish list we will let you know when it becomes available. |
Authors | Laung-terng Wang, Cheng-Wen Wu, Xiaoqing Wen |
Format | Paperback - Trade |
Pages | 808 |
ISBN-13 | 978-1-4933-0086-0 |
Barcode | 9781493300860 |
Categories | Books - All Books  Professional & TechnicalMechanical engineering & materialsMechanical engineeringGeneralBooks - All Books Professional & TechnicalEnergy technology & engineeringElectrical engineeringGeneral |
LSN | 1-4933-0086-5 |
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